[rtems commit] bsp/lpc176x: Remove blunt OPERATION_COUNT define

[Sebastian Huber]

Module:    rtems
Branch:    master
Commit:    26623e37fd9051ef17c029fb115988c9959c814c
Changeset: http://git.rtems.org/rtems/commit/?id=26623e37fd9051ef17c029fb115988c9959c814c

Author:    Sebastian Huber <sebastian.huber at embedded-brains.de>
Date:      Wed Mar 21 07:15:22 2018 +0100

bsp/lpc176x: Remove blunt OPERATION_COUNT define

BSP-specific test customization needs a more sophisticated approach.

Close #3352.

---

 bsps/arm/lpc176x/include/bsp.h | 3 ---
 1 file changed, 3 deletions(-)

diff --git a/bsps/arm/lpc176x/include/bsp.h b/bsps/arm/lpc176x/include/bsp.h
index e81e1cd..14c55f4 100644
--- a/bsps/arm/lpc176x/include/bsp.h
+++ b/bsps/arm/lpc176x/include/bsp.h
@@ -38,9 +38,6 @@
 #include <rtems.h>
 #include <bsp/default-initial-extension.h>
 
-/** Define operation count for Tests */
-#define OPERATION_COUNT 4
-
 #ifdef __cplusplus
 extern "C" {
 #endif /* __cplusplus */