[PATCH 03/33] libtest: Add T_busy()
Sebastian Huber
sebastian.huber at embedded-brains.de
Tue Jul 21 15:04:20 UTC 2020
Update #3199.
---
cpukit/Makefile.am | 1 +
cpukit/include/rtems/simple-test.h | 12 +---
cpukit/include/rtems/test.h | 4 +-
cpukit/libtest/t-test-busy.c | 58 +++++++++++++++++++
cpukit/libtest/testbusy.c | 20 +------
.../spintrcritical_support/intrcritical.c | 3 +-
6 files changed, 68 insertions(+), 30 deletions(-)
create mode 100644 cpukit/libtest/t-test-busy.c
diff --git a/cpukit/Makefile.am b/cpukit/Makefile.am
index abf18d176f..7f89f6a283 100644
--- a/cpukit/Makefile.am
+++ b/cpukit/Makefile.am
@@ -1857,6 +1857,7 @@ librtemstest_a_SOURCES += libtest/testextension.c
librtemstest_a_SOURCES += libtest/testparallel.c
librtemstest_a_SOURCES += libtest/testwrappers.c
librtemstest_a_SOURCES += libtest/t-test.c
+librtemstest_a_SOURCES += libtest/t-test-busy.c
librtemstest_a_SOURCES += libtest/t-test-checks.c
librtemstest_a_SOURCES += libtest/t-test-checks-eno.c
librtemstest_a_SOURCES += libtest/t-test-checks-psx.c
diff --git a/cpukit/include/rtems/simple-test.h b/cpukit/include/rtems/simple-test.h
index 873b8482af..5f73e92055 100644
--- a/cpukit/include/rtems/simple-test.h
+++ b/cpukit/include/rtems/simple-test.h
@@ -305,17 +305,7 @@ void rtems_test_parallel(
void rtems_test_busy_cpu_usage(time_t seconds, long nanoseconds);
/**
- * @brief Performs a busy loop with the specified iteration count.
- *
- * This function is optimized to not perform memory accesses and should have a
- * small jitter.
- *
- * @param[in] count The iteration count.
- */
-void rtems_test_busy(uint_fast32_t count);
-
-/**
- * @brief Returns a count value for rtems_test_busy() which yields roughly a
+ * @brief Returns a count value for T_busy() which yields roughly a
* duration of one clock tick.
*/
uint_fast32_t rtems_test_get_one_tick_busy_count(void);
diff --git a/cpukit/include/rtems/test.h b/cpukit/include/rtems/test.h
index ecdc03f94c..4c14e8d217 100644
--- a/cpukit/include/rtems/test.h
+++ b/cpukit/include/rtems/test.h
@@ -1,7 +1,7 @@
/*
* SPDX-License-Identifier: BSD-2-Clause
*
- * Copyright (C) 2018, 2019 embedded brains GmbH
+ * Copyright (C) 2017, 2020 embedded brains GmbH
*
* Redistribution and use in source and binary forms, with or without
* modification, are permitted provided that the following conditions
@@ -2261,6 +2261,8 @@ void T_case_body_##name(void)
#define T_TEST_CASE(name) T_TEST_CASE_FIXTURE(name, NULL)
+void T_busy(uint_fast32_t);
+
void T_report_hash_sha256(T_event, const char *);
void T_check_heap(T_event, const char *);
diff --git a/cpukit/libtest/t-test-busy.c b/cpukit/libtest/t-test-busy.c
new file mode 100644
index 0000000000..3bf149b8bb
--- /dev/null
+++ b/cpukit/libtest/t-test-busy.c
@@ -0,0 +1,58 @@
+/* SPDX-License-Identifier: BSD-2-Clause */
+
+/**
+ * @file
+ *
+ * @ingroup RTEMSTestFrameworkImpl
+ *
+ * @brief Implementation of T_busy().
+ */
+
+/*
+ * Copyright (C) 2014, 2020 embedded brains GmbH (http://www.embedded-brains.de)
+ *
+ * Redistribution and use in source and binary forms, with or without
+ * modification, are permitted provided that the following conditions
+ * are met:
+ * 1. Redistributions of source code must retain the above copyright
+ * notice, this list of conditions and the following disclaimer.
+ * 2. Redistributions in binary form must reproduce the above copyright
+ * notice, this list of conditions and the following disclaimer in the
+ * documentation and/or other materials provided with the distribution.
+ *
+ * THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS"
+ * AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE
+ * IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE
+ * ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT OWNER OR CONTRIBUTORS BE
+ * LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR
+ * CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF
+ * SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS
+ * INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN
+ * CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE)
+ * ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
+ * POSSIBILITY OF SUCH DAMAGE.
+ */
+
+#ifdef HAVE_CONFIG_H
+#include "config.h"
+#endif
+
+#include <rtems/test.h>
+
+/*
+ * It is important that we actually use the same T_busy() function at the
+ * various places. So, the compiler must not inline this function. Take care
+ * of link time optimization.
+ */
+__attribute__((__noinline__)) void
+T_busy(uint_fast32_t count)
+{
+ uint_fast32_t i;
+
+ i = 0;
+
+ do {
+ __asm__ volatile ("");
+ ++i;
+ } while (i < count);
+}
diff --git a/cpukit/libtest/testbusy.c b/cpukit/libtest/testbusy.c
index 4dd6f500a9..68a38fbbf9 100644
--- a/cpukit/libtest/testbusy.c
+++ b/cpukit/libtest/testbusy.c
@@ -19,6 +19,7 @@
#include <rtems/simple-test.h>
#include <rtems.h>
+#include <rtems/test.h>
#include <rtems/score/threadimpl.h>
static uint_fast32_t estimate_busy_loop_maximum( void )
@@ -45,21 +46,6 @@ static uint_fast32_t wait_for_tick_change( void )
return now;
}
-/*
- * It is important that we use actually use the same rtems_test_busy() function
- * at the various places, since otherwise the obtained maximum value might be
- * wrong. So, the compiler must not inline this function.
- */
-RTEMS_NO_INLINE void rtems_test_busy( uint_fast32_t count )
-{
- uint_fast32_t i = 0;
-
- do {
- __asm__ volatile ("");
- ++i;
- } while ( i < count );
-}
-
uint_fast32_t rtems_test_get_one_tick_busy_count( void )
{
uint_fast32_t last;
@@ -78,7 +64,7 @@ uint_fast32_t rtems_test_get_one_tick_busy_count( void )
while ( true ) {
last = wait_for_tick_change();
- rtems_test_busy( b );
+ T_busy( b );
now = rtems_clock_get_ticks_since_boot();
if ( now != last ) {
@@ -94,7 +80,7 @@ uint_fast32_t rtems_test_get_one_tick_busy_count( void )
m = ( a + b ) / 2;
last = wait_for_tick_change();
- rtems_test_busy( m );
+ T_busy( m );
now = rtems_clock_get_ticks_since_boot();
if ( now != last ) {
diff --git a/testsuites/sptests/spintrcritical_support/intrcritical.c b/testsuites/sptests/spintrcritical_support/intrcritical.c
index 51ab42f5d6..9bce230d2a 100644
--- a/testsuites/sptests/spintrcritical_support/intrcritical.c
+++ b/testsuites/sptests/spintrcritical_support/intrcritical.c
@@ -13,6 +13,7 @@
#include <tmacros.h>
#include <intrcritical.h>
+#include <rtems/test.h>
#define INTERRUPT_CRITICAL_NAME rtems_build_name( 'I', 'C', 'R', 'I' )
@@ -49,7 +50,7 @@ static bool interrupt_critical_busy_wait( void )
interrupt_critical.maximum_current = max - 1;
}
- rtems_test_busy( max );
+ T_busy( max );
return reset;
}
--
2.26.2
More information about the devel
mailing list